IEC 60748-1 pdf download.Semiconductor devices – Integrated circuits
1 Scope and object
This part of IEC 60748 gives general information on integrated circuits. The object of this part of IEC 60748 is to provide information on the general principles or requirements applicable to the IEC 60748 series, which includes the standards for the various categories or sub-categories of integrated circuits.
2 Normative references
The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies. For undated references, the latest edition of the referenced document (including any amendments) applies. IEC 60050-521, International Electrotechnical Vocabulary (IEV) – Part 521: Semiconductor devices and integrated circuits 1) IEC 60319:1999, Presentation and specification of reliability data for electronic components IEC 60617-12:1997, Graphical symbols for diagrams – Part 12: Binary logic elements IEC 60617-13:1993, Graphical symbols for diagrams – Part 13: Analogue elements IEC 60747-1:1983, Semiconductor devices – Discrete devices and integrated circuits – Part 1: General IEC 60748 (all parts), Semiconductor devices – Integrated circuits
For the purposes of this part of IEC 60748, the definitions relevant to integrated circuits given in chapter IV of IEC 60747-1, the definitions of IEC 60050-521 as well as the following definitions apply.4.1 General terms 4.1.1 terminal (of a semiconductor device) conductive element provided for external connection [IEV 521-05-02] 4.1.2 electrode (of a semiconductor device) conductive element in electric contact with a semiconductor that performs one or more of the functions of emitting or collecting electrons or holes, or of controlling their movements [IEV 521-05-01] 4.1.3 blank terminal terminal that has no internal connection and that can be used as a support for external wiring without disturbing the function of the device, if the voltage applied to this terminal (by means of the wiring) does not exceed the highest supply voltage rating of the circuit NOTE 1 The abbreviation should be NC (no internal connection). NOTE 2 If higher voltages are acceptable, this should be stated. 4.1.4 non-usable terminal terminal that is not used in normal applications and that may or may not have an internal connection NOTE The abbreviation should be NU. 4.1.5 microelectronics field of science and engineering that deals with highly miniaturized electronic circuits and their use [IEV 521-10-01] 4.1.6 integrated electronics art and technology of the design, fabrication and use of integrated circuits 4.1.7 latch-up characteristics of integrated circuits NOTE The letter symbols given in the titles are examples only. They show how the letter symbol for a particular latch-up characteristic is composed by adding a standardized additional subscript to the subscript in the letter symbol for the particular voltage or current. 220.127.116.11 latch-up state reversible state in which a low-impedance path has resulted from and persists following the current resulting from an input, output or supply overvoltage that triggers a parasitic four-layer bipolar structure [IEV 521-10-11] 18.104.22.168 latch-up process that results in a latch-up state22.214.171.124 latch-up state (supply) current (I CC(L) , I DD(L) ) current flowing either in or out of a specified supply terminal of an integrated circuit when the integrated circuit is in the latch-up state 126.96.36.199 latch-up state holding current (I CC(L)min , I DD(L)min ) minimum latch-up state (supply) current necessary to hold an integrated circuit in the latch-up state 188.8.131.52 latch-up state (supply) voltage (V CC(L) , V DD(L) ) supply voltage between the relevant device terminals at a specified supply current when the integrated circuit is in the latch-up state 184.108.40.206 latch-up current (I Xlatch , I latch ) lowest current of a specified duration flowing either in or out of a specified terminal of an integrated circuit that causes latch-up to occur 220.127.116.11 latch-up voltage (V Xlatch , V latch ) lowest voltage of a specified duration applied to a specified terminal of an integrated circuit that causes latch-up to occur 18.104.22.168 latch-up supply current (I CClatch , I DDlatch ) lowest current of a specified duration flowing either into or out of a specified supply terminal of an integrated circuit that causes latch-up to occur 22.214.171.124 latch-up supply voltage (V CClatch , V DDlatch ) lowest value of a supply voltage of a specified duration applied to the relevant device terminals of an integrated circuit that causes latch-up to occur