IEC 60749-3 pdf download

IEC 60749-3 pdf download.Semiconductor devices – Mechanical and climatic test methods 1 Scope The purpose of this part of IEC 60749 is to verify that the materials, design, construction, markings, and workmanship of a semiconductor device are in accordance with the applicable procurement document. External visual inspection is a non-destructive test and applicable for all package types. The test is...