IEC 60749-7 pdf download

IEC 60749-7 pdf download.Semiconductor devices – Mechanical and climatic test methods 3 Test apparatus The apparatus for testing the internal water vapour content and that of other gases shall be as follows for the chosen method. 3.1 Method 1 Method 1 measures the water vapour content of the device atmosphere by mass spectro- metry. The apparatus for method 1 shall...